XRD Quartz Sample Holder: The Definitive Engineering & Procurement Guide for Zero-Background X-Ray Diffractometry

While single-crystal silicon cut along the (510) plane is a widely recognized zero-background material, silicon is vulnerable to chemical oxidation, mechanical surface scratching by metal spatulas, and aggressive chemical attack by basic solutions. High-purity single-crystal quartz possesses superior Mohs hardness (7.0 vs. 6.5 for Si), significantly higher abrasion resistance during repeated sample mounting and scraping, and outstanding resistance to virtually all acids. Furthermore, in non-ambient thermal stages, quartz maintains structural stability without surface oxidation artifacts that commonly affect silicon above 600°C.

We slice our single-crystal quartz along strict crystallographic miscut orientations (specifically tilted away from major diffracting planes such as (0001) or (10-10)). Each crystal ingot is verified prior to fabrication using goniometric X-ray orientation. When mounted in symmetrical reflection geometry diffractometers (such as Bragg-Brentano $\theta-\theta$ or $\theta-2\theta$), no reciprocal lattice points intersect the Ewald sphere within the scanning range, delivering an exceptionally quiet, flat baseline with zero unwanted peak interference.

The optimal well depth is governed by sample quantity, X-ray absorption coefficients, and sample transparency. For highly absorbing heavy-metal powders or microgram quantities (such as expensive organic syntheses or pharmaceuticals), shallow wells of 0.05 mm to 0.1 mm are strongly recommended to prevent peak displacement errors while reducing the required specimen volume. For low-absorbing organic materials, polymers, or light elements where beam penetration is significant, deeper cavities of 0.5 mm to 1.0 mm prevent the beam from penetrating through to the substrate.

Yes. As a verified custom manufacturer, we routinely fabricate round discs (standard diameters: 25 mm, 28 mm, 30 mm, 32 mm, 51.5 mm), square plates (e.g., 20x20 mm, 25x25 mm), rectangular slides, and grooved chips tailored exactly to instrument holders from Bruker, Malvern Panalytical, Rigaku, Shimadzu, Thermo Fisher, and specialized synchrotron beamline stages. We accommodate non-standard outer diameters, notchings, multi-well layouts, and asymmetric steps with precision CNC tolerances down to ±0.02 mm.

Because our quartz holders are optically polished and chemically inert, residues should be rinsed immediately after analysis using analytical-grade ethanol, acetone, or deionized water, followed by drying with oil-free nitrogen gas. For stubborn organic residues, mild ultrasonic baths or immersion in dilute nitric acid is safe. Avoid abrasive cleaning powders or hydrofluoric acid (HF), as mechanical scouring or HF etching damages the optical planar finish, introducing diffuse background scattering.

Our minimum order quantity starts at just 1 piece for prototypes and custom configurations, with batch manufacturing scaling to thousands. Standard prototypes ship within 7–12 business days. Every optical XRD holder is individually enclosed in a cleanroom antistatic gel-pack container, multi-layer bubble wrapped, shock-isolated, and packed into reinforced export cartons or wooden crates for guaranteed safe global transit via FedEx, DHL, or UPS.